AGILENT 5517C Laser Red Interferometer

AGILENT 5517C Laser Red Interferometer

Product Details Introduction

The Agilent 5517C laser red interferometer is a high-precision interferometer produced by Agilent Technologies, mainly used for precision measurement and surface morphology analysis. Agillent 5517C is a high-end model in the interferometer product line, designed specifically for high-precision optical interferometry measurement. It is suitable for various high-precision measurement fields, especially in scientific research, manufacturing, semiconductor manufacturing, and precision machining, and has important applications.

Main features:

High precision measurement:

The Agilent 5517C laser red interferometer uses laser interferometry technology to provide nanometer level precision measurements. Its resolution can reach the nanometer level, suitable for precise measurement of surface morphology, displacement, vibration and other parameters.

Through the principle of interference, it is possible to accurately measure small changes on the surface of an object, such as thickness, shape, gaps, surface contours, etc.

Laser source:

Using a red laser source (wavelength of 632.8 nm), this wavelength of laser has high stability and accuracy, providing clear and stable interference fringes to ensure high accuracy of measurement results.

The use of lasers can improve the signal strength of the system, ensuring accurate measurement results even in complex experimental environments.

Interference principle:

This instrument operates based on the principle of laser interference. By comparing the phase difference between the reference beam and the reflected beam of the test object, Agilent 5517C can accurately calculate small changes in the surface or displacement of the object.

Interferometers can measure surface morphology, object motion or displacement by analyzing the changes in interference fringes, and are suitable for dynamic and static measurements.

Applicable fields:

Optical surface measurement: used to measure surface morphology, such as flatness, surface roughness, etc.

Displacement and vibration measurement: suitable for high-precision displacement measurement and dynamic vibration analysis, commonly used for testing precision machinery and automation equipment.

Micro components and semiconductor measurement: widely used in the measurement of micro components and microstructures in semiconductor manufacturing to ensure the dimensional accuracy of products.

Research and development: In the field of scientific research, especially in physics, materials science, and nanotechnology, the 5517C laser interferometer can provide accurate surface analysis data.

High stability and repeatability:

This device has excellent stability and can provide measurement results with high repeatability and low noise. Even under significant changes in environmental conditions, high accuracy can still be maintained.

User friendly interface:

The Agilent 5517C is equipped with an intuitive user interface, allowing users to easily set up and operate the instrument for measurement and data analysis.

Provide various data output formats to facilitate users in recording, processing, and further analyzing measurement results.

Multiple application attachments and functions:

This device can be used in conjunction with various accessories, such as optical mirrors, detectors, scanning platforms, etc., to expand its functionality and application range. Suitable for different measurement tasks and workpiece sizes.

It can also perform real-time on-site measurements, suitable for use in production lines or laboratory environments.

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