GE DS200SDCCG4AFD Channel relay module

The two pins of each socket on a test fixture board which make up the reference pin pair are (1) the socket pin with the shortest wiring path to the pulse generation circuit (Terminal B) and (2) the socket pin with the longest wiring path from the pulse generation circuit (Terminal A) to the ESD stress socket. (See Figure 1). This information is typically provided by the equipment or test fixture board manufacturer. If more than one pulse generation circuit is connected to a socket then there may be more than one reference pin pair

Waveform Capture with Current Probe 

To capture a current waveform between two socket pins (usually the reference pin pair), use the shorting wire (Section 4.1.3, Load 1) for the short circuit measurement or the 500 ohm resistor (Section 4.1.3, Load 2) for the 500 ohm current measurement and the inductive current probe It is recommended that on non-positive clamp fixtures, feed through test point pads be added on these paths. These test points should be added as close as possible to the socket(s). NOTE: A positive clamp test socket is a zero insertion force (ZIF) socket with a clamping mechanism. It allows the shorting wire to be easily clamped into the socket. Examples are dual in-line package (DIP) and pin grid array (PGA) ZIF sockets.

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