GE DS215GASCG4AZZ01A Overspeed Tachometer Module

Three new components may be used at each voltage level or pin combination if desired. This will eliminate any step-stress hardening effects, and reduce the possibility of early failure due to cumulative stress. Due to potential failure windows, low ESD performance may not be detected if levels specified in Table 1 are skipped during testing. It is recommended not to skip any levels specified in Table 1.

Devices For Each Voltage Level 

A sample of three devices for each voltage level shall be characterized for the device ESD failure threshold using the voltage levels shown in Table 1. Finer voltage steps may optionally be used to obtain a more accurate measure of the failure threshold, and to improve detection of devices exhibiting failure windows. ESD testing should begin at the lowest level in Table 1 but may begin at any level. However, if the initial voltage level is higher than the lowest level in Table 1, and the device fails at the initial voltage, testing shall be restarted with three fresh devices at the next lowest level. (e.g. If the initial voltage is 1000 volts and the device fails, restart the test at 500 volts.) The ESD test shall be performed at room temperature.

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