MOTOROLA MVME133XT Switch input module

Testing After Stressing If a different sample group is tested at each stress level, it is permitted to perform the DC parametric and functional testing after all sample groups have been ESD tested. NOTE: If this alternative test method is used on a supply pin group that has more than a small number of pins, tester parasitic capacitance will increase (i,e., slow down) the rise time of the signal. Longer rise times may cause dynamic ESD protection circuits not to function properly (See Annex C.3).

Alternative Pin Stress Method for Non-Supply Pins 

A non-supply to supply pin stress in Table 2 may be replaced by its corresponding supply pin to non-supply pin stress. If only a single polarity stress is being replaced, the opposite polarity stress shall be used. As non-supply pins are not typically tied to other pins, this will require each supply pin of the supply pin group to be stressed to each non-supply pin individually. If the nonsupply pin is tied to other pins, they shall be left floating. Typically, the non-supply to supply pin negative polarity stress will be replaced with the supply to non-supply pin, positive polarity stress. This allowance is useful when the slew rate of the HBM pulse is impacted by parasitic capacitance of the open relays.

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